Advances in X-Ray Analysis: Volume 39
J. L. de Vries (auth.), John V. Gilfrich, Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith, Paul K. Predecki (eds.)
Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry; J.L. de Vries.Conditoningof X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction; M.Schuster, H. Gobel.Stress and Strain Determination by DiffractionMethods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction; V. Hauk.Characterization of Polymers, AmorphousMaterials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers; N.S. Murthy.Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples; V. Valvoda, et al.Characterization of Thin Films byX-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films; I.C. Noyan, C.C. Goldsmith.Other Applications of X-RayDiffractions Including High-Temperature and Nonambient: TotalReflection XRF and Trace Analysis: Quantitative ZRF DataInterpretation and Other XRF Applications. 95 Additional Articles. Index.
Kategorie:
Rok:
1998
Wydawnictwo:
Springer US
Język:
english
Strony:
1998
ISBN 10:
1461553776
ISBN 13:
9781461553779
Plik:
PDF, 47.60 MB
IPFS:
,
english, 1998
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